This publication takes stock of the recent developments in the field. It provides guiding principles for the use of patent data in the context of S&T measurement, and recommendations for the compilation and interpretation of patent indicators in this context. It aims to show what patent statistics can and cannot be used for, and how to count patents in order to maximize information on S&T activities while minimizing statistical noise and biases. Finally, it describes how patent data can be used in the analysis of a wide array of topics related to technical change and patenting activity including industry-science linkages, patenting strategies by companies, internationalization of research, and indicators on the value of patents.--Publisher's description.